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实验室简介
Our research projects involve reliability issues of optical devices, primarily III-V nitride and SiC semiconductors, ferroelectric materials, especially the temperature measurments and thermal management. We also provide home-made thermal resistance tester, enabling to measure the thermal resistant of each vertical material.
Congratulations to the Successful Meeting of “Key Technology and Application of Non-destructive Testing of Semiconductor Device Junction Temperature and Electronic System Thermal Resistance——Scientific and Technological Achievement Appraisal”
Graduation trip in 2018(FangShan, Beijing)
Graduation trip in 2019(MiYun, Beijing)
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