联系我们
意见反馈

关注公众号

获得最新科研资讯

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

分享到

Online Temperature Measurement Method for SiC MOSFET Device Based on Gate Pulse

2024
期刊 IEEE Transactions on Power Electronics
  • 卷 39
  • 期 4
  • 页码 4714-4724
  • Institute of Electrical and Electronics Engineers (IEEE)
  • ISSN: 0885-8993
  • DOI: 10.1109/tpel.2024.3351169