联系我们
意见反馈

关注公众号

获得最新科研资讯

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

分享到

Investigation on the passivation at the GeOx/Ge interface trap with high oxidation state in GeOx formed by ozone oxidation

2023
期刊 Journal of Materials Science: Materials in Electronics