Characterization of traps in GaN-based HEMTs by drain voltage transient and capacitance deep-level transient spectroscopy

Effect of Biaxial Bending Strains on the Electrical Characteristics of Flexible Low-Temperature Polysilicon Thin-Film Transistors

Effect of interface morphology on thermal contact resistance in thermal management of electronic devices

Experimental investigation on dipole and band offset affected by charge neutrality level modulation

Experimental study on the reliable working life of PUF chip for 8 years

Identification of Traps in p-GaN Gate HEMTs During OFF-State Stress by Current Transient Method

Implementation of Fast Measurement System of Semiconductor Device Parameter Temperature Coefficient Based on FPGA

Research on temperatures located within facet coating layers along z-axis of semiconductor lasers

Research on transient thermal behavior of semiconductor lasers under pulse current excitation by thermoreflection technique

Strain distribution and electrical characteristics of flexible low-temperature polysilicon thin film transistors under biaxial bending

Wake-up effect in Hf_0.4Zr_0.6O₂ ferroelectric thin-film capacitors under a cycling electric field

Analysis of the Effects of High-Energy Electron Irradiation of GaN High-Electron-Mobility Transistors Using the Voltage-Transient Method

A new method for detecting heteromorphic workpiece brazing layer quality based on thermal probe

Build-in compact and efficient temperature sensor array on field programmable gate array

Characterization of thermal-resistance in Ga2O3 Schottky barrier diodes with temperature-sensitive electrical parameters

Effect of high- and low-side blocking on short-circuit characteristics of SiC MOSFET

Effects of gamma irradiation on GaN high-electron-mobility transistors characterized by the voltage-transient method

Effects of temperature and bias voltage on electron transport properties in GaN highelectron-mobility transistors

Identifying the Properties of Traps in GaN High-Electron-Mobility Transistors via Amplitude Analysis Based on the Voltage-Transient Method

Low-cost reconfigurable temperature sensor array on field programmable gate array

Multi-physics field coupling simulation modeling and analysis of StakPak insulated gate bipolar transistor device

Nondestructive Measurement for Front Facet Temperature of Semiconductor Lasers

Non-destructive peak junction temperature measurement of double-chip IGBT modules with temperature inhomogeneity

Non-destructive testing of heteromorphic workpiece brazing layer quality based on heat conduction

Research on the Wake-up Effect of Ferroelectric HfO2-ZrO2 Thin Films

Study of traps in low-temperature polysilicon thin film transistors using a current transient method

A Drain–Source Connection Technique: Thermal Resistance Measurement Method for GaN HEMTs Using TSEP at High Voltage

Effect of Surface Roughness on Thermal Contact Resistance of Fixed Interface in Thermal Measurement of Electron Device

Effect of Uniaxial Tensile Strains at Different Orientations on the Characteristics of AlGaN/GaN High-Electron-Mobility Transistors