Monitoring of defects creation sequence in 808 nm laser diode by reflectance analysis

Real-time measurement and control of junction temperature of VDMOS in power cycle test

The study of temperature-dependent degradation of optical output on 808 nm GaAs-Based High-Power Laser Diode Bars

A new method for detecting thermal characteristics of slow-wave structure of helix traveling-wave tube using external heat source

A New Method for Measuring Thermal Characteristics of Multistage Depressed Collectors

A voltage-transient method for characterizing traps in GaN HEMTs

Evidence of GaN HEMT Schottky Gate Degradation After Gamma Irradiation

Identifying the Traps in the Channel Region in GaN-based HEMTs Using a Nonmonotone Drain Current Transient

Junction Temperature Measurement Method for SiC Bipolar Junction Transistor Using Base-Collector Voltage Drop at Low Current

Photocurrents in GaN-based HEMTs: Theoretical model and experimental results

Temperature distribution measurement based on field-programmable gate array embedded ring oscillators

The thermal characterization of packaged semiconductor device

A current-transient method for identifying the spatial positions of traps in GaN-based HEMTs

A current transient method for trap analysis in BiFeO3 thin films

Bipolar Resistive Switching Effect in BiFeO3/Nb:SrTiO3 Heterostructure by RF Sputtering at Room Temperature

Effect of post-deposition annealing pressure on bipolar resistive switching in RF sputtered BiFeO<inf>3</inf>/Nb:SrTiO<inf>3</inf> heterostructure

Effect of substrate thinning on the electronic transport characteristics of AlGaN/GaN HEMTs

Effect of two-dimensional electron gas on horizontal heat transfer in AlGaN/AlN/GaN heterojunction transistors

Evaluation of the Schottky Contact Degradation on the Temperature Transient Measurements in GaN HEMTs

Fatigue behavior of resistive switching in a BiFeO3 thin film

Junction Temperature Measurement Method for Power mosfets Using Turn-On Delay of Impulse Signal

Junction Temperature measurement of SiC BJT via the voltage drop of V<inf>BC</inf>

Substrate thinning and external stress effect on the output characteristics of AlGaN/GaN HEMTs

Temperature distribution measurement for chips based on FPGA

A New Differential Amplitude Spectrum for Analyzing the Trapping Effect in GaN HEMTs Based on the Drain Current Transient

Influence of heat source size on thermal resistance of AlGaN/GaN HEMT

Monitoring of early catastrophic optical damage in laser diodes based on facet reflectivity measurement

Optimized thermal sensor allocation for field-programmable gate array temperature measurements based on self-heating test

Rapid test method for thermal characteristics of semiconductor devices