Analysis of the hybrid trapping effect in GaN HEMTS based on the current transient spectroscopy

Effect of poling process on resistive switching in Au/BiFeO3/SrRuO3 structures

Identifying the spatial position and properties of traps in GaN HEMTs using current transient spectroscopy

Thermal analysis in high power GaAs-based laser diodes

All-digital thermal distribution measurement on field programmable gate array using ring oscillators

B13-P-01Temperature Characterization of Self-heating in GaN-based Transistors by Cathodeluminescence Spectroscopy

Degradation Analysis of Facet Coating in GaAs-Based High-Power Laser Diodes

Degradation of the die attach layer in chip-on-board packaged light-emitting diodes during temperature cycling

Measuring temperature in GaN-based high electron mobility transistors by cathodoluminescence spectroscopy

Mechanism of the self-changing parameters and characteristics in AlGaN/GaN high-electron mobility transistors after a step voltage stress

The research on temperature distribution of GaN-based blue laser diode

Thermal investigation of LED array with multiple packages based on the superposition method

Thermal time-constant spectrum extraction method in AlGaN/GaN HEMTs

Variation of Dominant Degradation Mechanism in AlGaN Barrier Layer With Different Voltage Stress on the Gate of AlGaN/GaN High Electron Mobility Transistors

Cycled Thermomechanical Failure in 808-nm High-Power AlGaAs/GaAs Laser Diode Bars

Determining Drain Current Characteristics and Channel Temperature Rise in GaN HEMTs

Effect of Self-Heating on the Drain Current Transient Response in AlGaN/GaN HEMTs

Evaluation of the drain—source voltage effect on AlGaAs/InGaAs PHEMTs thermal resistance by the structure function method

Identifying the failure mechanism in accelerated life tests by two-parameter lognormal distributions

Self-heating and traps effects on the drain transient response of AlGaN/GaN HEMTs

The channel temperature dependence of drain transient response in AlGaN/GaN HEMTs

Thermal analysis of multiple light sources based on the superposition method

Transient and long-term catastrophic optical damage in high power AlGaAs/GaAs laser diodes

Working Thermal Stresses in AlGaAs/GaAs High-Power Laser Diode Bars Using Infrared Thermography

Assessment of pulse conditions effects on reliability in GaN-based high electron mobility transistors by transient temperature measurements

The degradation and recovery properties of AlGaN/GaN high-electron mobility transistors under direct current reverse step voltage stress

The thermal properties of AlGaAs/GaAs laser diode bars analyzed by the transient thermal technique

Transient thermal characteristics related to catastrophic optical damage in high power AlGaAs/GaAs laser diodes

Two-dimensional transient simulations of the self-heating effects in GaN-based HEMTs